Improved analysis of DNA short tandem repeats with time-of-flight mass spectrometry : science and technology research report /

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Bibliographic Details
Main Author: Butler, John M. (John Marshall), 1969-
Corporate Author: National Institute of Justice (U.S.)
Other Authors: Becker, Christopher H
Format: Book
Language:English
Published: Washington, DC : U.S. Dept. of Justice, Office of Justice Programs, National Institute of Justice, [2001]
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Government Documents

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Call Number: GOVDOCS J 28.2:D 44/3
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