A student's guide to data and error analysis / by Berendsen, Herman J. C., PALCI EBSCO books

Table of Contents: “…Combining uncertainties -- Systematic deviations due to random errors -- Characteristic function -- From binomial to normal distributions -- Central limit theorem -- Estimation of th varience -- Standard deviation of the mean -- Weight factors when variances are not equal -- Least squares fitting -- Python codes -- Scientific data.…”
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Doubt-free uncertainty in measurement : an introduction for engineers and students / by Ratcliffe, Colin, Ratcliffe, Bridget, SpringerLink (Online service)

Table of Contents: “…""; ""Final reminder ""; ""Chapter 3""; ""Standard Uncertainty of a Measurement""; ""Finding the Standard Uncertainty when an Uncertainty Is Quoted at a Certain Level of Confidence""; ""Finding the Standard Uncertainty when an Elemental Uncertainty Is Given as a Standard Deviation with No Information About the Sample Size""…”
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Optimal oil production and the world supply of oil / by Aleksandrov, Nikolay, PALCI EBSCO books, International Monetary Fund. Research Department

Table of Contents: “…Concluding Remarks and the World Supply of Oil; References; Figures; 1. Standard Deviation of Change in Reserves; 2. Optimal Extration-Brazil and U.A.E; 3. …”
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Nanofibers : fabrication, performance, and applications / by ProQuest Ebook Subscriptions

Table of Contents: “…""RESPONSE SURFACES FOR MEAN FIBER DIAMETER""""RESPONSE SURFACES FOR STANDARD DEVIATION OF FIBER DIAMETER ""; ""CONCLUSION ""; ""APPENDIX ""; ""REFERENCES ""; ""CARBON NANO-FIBERS AND THEIR APPLICATIONS: DERIVED FROM ELECTROSPINNING AND VAPOR GROWN PROCESSES ""; ""ABBREVIATIONS ""; ""1. …”
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Probabilistic design for optimization and robustness for engineers / by Dodson, Bryan, 1962-, Safari Books Online

Table of Contents: “…5.3 Limitations of first-order Taylor series approximation for variance5.4 Effect of non-normal input distributions; 5.5 Nonconstant input standard deviation; 5.6 Summary; Exercises; 6 Desirability; 6.1 Introduction; 6.2 Requirements and scorecards; 6.2.1 Types of requirements; 6.2.2 Design scorecard; 6.3 Desirability-single requirement; 6.3.1 Desirability-one-sided limit; 6.3.2 Desirability-two-sided limit; 6.3.3 Desirability-nonlinear function; 6.4 Desirability-multiple requirements; 6.4.1 Maxi-min total desirability index; 6.5 Desirability-accounting for variation.…”
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Timing performance of nanometer digital circuits under process variations / by Champac, Victor, Gervacio, Jose Garcia, SpringerLink (Online service)

Table of Contents: “…3.5 Parameter Modeling3.6 Spatial Correlation Modeling; 3.6.1 Exponential Model; 3.6.1.1 Example; 3.6.2 Grid Model; 3.7 Summary; References; 4 Gate Delay Under Process Variations; 4.1 Mathematical Formulation of the Statistical Delay of a Logic Gate; 4.1.1 Mean Delay of a Gate; 4.1.2 Variance of the Delay of a Gate; 4.2 Delay of Logic Gates Under Process Variations; 4.3 Computing Delay Variance of an Inverter; 4.3.1 Analytical Delay Model; 4.3.2 Sensitivity Delay Model; 4.3.3 Example of Computing Delay Standard Deviation of an Inverter; 4.4 Computing Delay Variance of a Nand Gate.…”
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Spectrum and network measurements / by Witte, Robert A., PALCI EBSCO books

Table of Contents: “…Mean, Variance, and Standard Deviation -- 8.3. Power Spectral Density -- 8.4. …”
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The second-order adjoint sensitivity analysis methodology / by Cacuci, Dan Gabriel, PALCI EBSCO books

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