2007 IEEE International Conference on Microelectronic Test Structures ICMTS : conference proceedings : March 19-22, Takeda Hall, the University of Tokyo, Japan /

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Bibliographic Details
Corporate Authors: IEEE International Conference on Microelectronic Test Structures University of Tokyo, IEEE Electron Devices Society, IEEE XPlore Conference Proceedings Online
Format: Online Conference Proceeding Book
Language:English
Published: IEEE, 2007
Subjects:
Online Access:http://ezproxy.villanova.edu/login?URL=http://ieeexplore.ieee.org/servlet/opac?punumber=4252392
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Description
Physical Description:1 online resource (xi, 275 p.) : ill. (some col.)
ISBN:142440780X
1424407818
9781424407804
9781424407811