VLSI design and test : 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised selected papers /

VLSI design and test : 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised selected papers /

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Bibliographic Details
Corporate Authors: VDAT (Symposium) Indore, India), SpringerLink (Online service)
Other Authors: Sengupta, Anirban (Editor), Dasgupta, Sudeb (Editor), Singh, Virendra (Associate professor of electrical engineering) (Editor), Sharma, Rohit (Rohit Y.) (Editor), Vishvakarma, Santosh Kumar (Editor)
Format: Online Conference Proceeding Book
Language:English
Published: Springer, 2019
Series:Communications in computer and information science ;
Subjects:
Integrated circuits Very large scale integration Testing Congresses.
Integrated circuits Very large scale integration Design and construction Congresses.
Electronic books.
Online Access:http://ezproxy.villanova.edu/login?URL=https://link.springer.com/10.1007/978-981-32-9767-8
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Description
Physical Description:1 online resource (xvi, 775 pages) : illustrations (some color).
ISBN:9789813297678
9813297670
ISSN:1865-0929 ;

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